发明名称 APPARATUS FOR SIMULTANEOUSLY MEASURING NORMAL LINE DIRECTION AND UNDULATION OF SURFACE OF WORK
摘要 PURPOSE:To make it possible to measure the normal line direction of the surface of a work, by providing four sensors, low-pass filters and high-pass filters supported in a freely rotatable manner. CONSTITUTION:When the probe needles of four sensors 1, 1,... are contacted with a free curved surface of a work 15, said probe needles are contacted with the recessed and protruded parts of a cut groove and the variance H measured by the sensors 1, 1,... is varied. Next, low-pass filters 2 are individually connected to individual sensors 1 one at a time in series to remove electrical noise. Then, the direction of a normal line at a measuring point x1 is calculated under such a condition that the effect of the cut groove is removed by a signal processor 20. When the roughness of the free curved surface of the work 15 is measured, the transmission route of a detected value is changed over from the side of low-pass filters 2 to the side of high-pass filters 3 and only the high frequency component corresponding to the cut groove is sent out to the signal processor 20 and the roughness of the curved surface can be measured.
申请公布号 JPS61205815(A) 申请公布日期 1986.09.12
申请号 JP19850046979 申请日期 1985.03.08
申请人 SANYO KIKO KK 发明人 ONO TSUKANE
分类号 B24B17/10;B24B17/00;B24B49/00;B24B49/02;G01B7/287;G01B7/34;G01B21/00;G01B21/20;G01B21/22;G01B21/30 主分类号 B24B17/10
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