发明名称 Fabrication of silicon structures by single side, multiple step etching process
摘要 Three dimensional silicon structures are fabricated from {100} silicon wafers by a single side, multiple step ODE etching process. All etching masks (26, 28) are formed one on top of the other prior to the initiation of etching, with the coarsest mask (28) formed last and used first. Once the coarse anisotropic etching is completed, the coarse mask is removed and the finer anisotropic etching is done. The three dimensional structure may be a thermal ink jet channel plate, in which case the etching process is a two-step process in which the coarse etching step provides the ink reservoir (30) and the fine etching step provides the ink channels (32).
申请公布号 US4863560(A) 申请公布日期 1989.09.05
申请号 US19880234994 申请日期 1988.08.22
申请人 XEROX CORP 发明人 HAWKINS, WILLIAM G.
分类号 B41J2/05;B41J2/16;B81B1/00;C30B29/06;G02B6/36;H01L21/302;H01L21/306;H01L21/3065;H01L21/308 主分类号 B41J2/05
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