BIT ERROR RATIO MEASUREMENT METHOD AND ITS CIRCUIT,申请号JP19910038591-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	BIT ERROR RATIO MEASUREMENT METHOD AND ITS CIRCUIT
摘要
申请公布号	JPH04276934(A)	申请公布日期	1992.10.02
申请号	JP19910038591	申请日期	1991.03.05
申请人	FUJITSU LTD	发明人	KIMURA TERUO
分类号	H04B3/46;H04L1/00;H04L1/22	主分类号	H04B3/46
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Manufacturing method for honeycomb-like structural body, and the honeycomb-like structural body

Silicone hydrogel lenses with convertible comfort agents

Method and shaping device for producing a composite fiber component for air and space travel

Method for creating an overlap by sheet welding

Fluid exchange methods and devices

Aorta and branch vessel stent grafts and method

Anti-migration biliary stent and method

Expandable interbody fusion device

Expandable interbody fusion device

Prothesis for the replacement of a posterior element of a vertebra

Collapsible prosthetic valve having an internal cover

Apparatus and method for providing failed-attempt feedback using a camera on glasses

Method and apparatus for patterned plasma-mediated laser trephination of the lens capsule and three dimensional phaco-segmentation

Vitrectomy probe with adjustable cutter port size

Cement delivering device and method

Method for balloon-aided vertebral augmentation

Spine stabilization

Method for passively decoupling torque applied by a remote actuator into an independently rotating member

Method and apparatus for dermatological treatment and tissue reshaping

Surgical staple insertion device