发明名称 NEAR INFRARED POLYETHYLENE INSPECTION SYSTEM AND METHOD
摘要 A sample inspection arrangement incorporates a sample of natural polyethylene with an included defect, or flaw, a light source containing near infrared wavelengths, and a video camera. Natural polyethylene has relatively high spectral transmissivity for wavelengths in the band of near infrared wavelengths. The video camera collects data from a beam of the near infrared light which either reflects from or is transmitted directly through a portion of the natural polyethylene sample. Data is collected from both defect free portions of the polyethylene sample and portions of polyethylene sample including at least one defect. A visual image of the polyethylene sample and included defect is produced on either a video monitor, a paper print out, or a photograph. The method for inspecting a sample of cable or a continuously moving section of cable also is described.
申请公布号 CA2001666(C) 申请公布日期 1994.12.13
申请号 CA19892001666 申请日期 1989.10.27
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 ORTIZ, MARCOS G.;STIX, MARSHA S.
分类号 G01N21/88;G01N21/89;G01N21/892;G01N21/95;G01N21/952;H01B3/44;H01B9/02;H04N7/18;(IPC1-7):G01N21/89 主分类号 G01N21/88
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