FLASH VERIFY SCHEME OF NON-VOLATILE MEMORY DEVICE

摘要

Disclosed is an erase test equipment including a comparator and a pulse generator. The comparator compares an output of a sense amplifier sensing and amplifying data of a cell read with an output of a data latch circuit which stores erase data input from outside of the device. The pulse generator is controlled by an output of a control circuit which controls the device operation and outputs a pulse signal which operates the comparator for a constant time by considering the time that the data output from the cell of erase state is sensed and amplified enough at the sense amplifier. Thus, The erase test equipment operates regardless of temperature variation and a driving supply voltage.