发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To improve efficiency at the time of evaluating output driver capability of an output terminal. SOLUTION: This device is provided with a test use control logic 1 which produces and outputs test use output data to determine an output from an output driver of an output terminal and an input-output terminal based on a signal inputted from a test use input terminal 16, and also generates and outputs a control signal to obtain the above output from the output terminal and the input-output terminal; a test use output data holding circuit 3 which holds the test use output data outputted from the logic 1; and selective switching circuits 2 and 6 to 13 which simultaneously obtain the outputs from the entire output terminals and input-output terminals based on the test use output data held by the circuit 3 and the above control signal.
申请公布号 JPH11203162(A) 申请公布日期 1999.07.30
申请号 JP19980007944 申请日期 1998.01.19
申请人 MITSUBISHI ELECTRIC CORP 发明人 SAIKI NOBUYUKI
分类号 G01R31/28;G06F11/22;G06F15/78;H01L21/822;H01L27/04 主分类号 G01R31/28
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