Semiconductor device for determining electrical characteristics of checking device for semiconductor devices, has many terminal contacts, controller, many measuring units and trigger logic with many inputs and outputs

摘要

Semiconductor device (1) has many terminal contacts (s1-sn), controller with processor (30), pulse generator (40) and storage (50,60). The controller is connected to a data and instruction bus (20). Many measuring units (10) are connected to terminal contact and data and instruction bus. A trigger logic (70) has many inputs and outputs. A measuring unit has a scanning unit for scanning of input signals applied over the arranged terminal contacts. A communication unit changes the digital data at terminal contacts. A signal generator detects an output signal at the arranged terminal contact. A receiver unit detects an external trigger signal applied at the arranged terminal contacts. The Inputs are attached at the receiver unit of one of the measuring units under avoidance of data-and instruction bus. The outputs are attached at the scanning unit and the signal generator of one of the measuring units under avoidance of the data-and instruction bus. Independent claims are also included for the following: (A) Arrangement for the characterization of a checking device; and (B) Method for characterization of a checking device.