| 摘要 |
A semiconductor device, a test circuit for testing the same, and a test method therefor are provided to set a frequency bandwidth in which clock data recovery is not performed by controlling a frequency performance of a CDR(Clock and Data Recovery) circuit. A semiconductor device includes a CDR(Clock and Data Recovery) circuit(16), a frequency following control circuit(15), a serializer(12), a deserializer(11), and a pattern comparator(14). The CDR circuit performs CDR for input serial data which is synchronized with a spread spectrum clock. The frequency following control circuit is configured to control a frequency bandwidth to be followed by the CDR circuit. The serializer converts first parallel data into serial data, and is synchronized with the spread spectrum clock. The serializer outputs the serial data. The deserializer converts the serial data into second serial data. The deserializer is synchronized with a synchronization clock which is recovered from the serial data by the CDR circuit, and outputs the second parallel data. The pattern comparator compares the first parallel data with the second parallel data, and outputs the comparison result.
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