发明名称 |
Technique for creating different mechanical strain by a contact etch stop layer stack with an intermediate etch stop layer |
摘要 |
The present invention provides a technique for forming differently stressed contact etch stop layers, wherein sidewall spacers are removed prior to the formation of the contact etch stop layers. During the partial removal of respective contact etch stop layers, a corresponding etch stop layer regime is used to substantially avoid any unwanted stress-inducing material residuals, thereby significantly enhancing the stress transfer mechanism.
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申请公布号 |
US7482219(B2) |
申请公布日期 |
2009.01.27 |
申请号 |
US20060424272 |
申请日期 |
2006.06.15 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
FROHBERG KAI;PETERS CARSTEN;SCHALLER MATTHIAS;SALZ HEIKE |
分类号 |
H01L21/8238 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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