发明名称 |
MANUFACTURING APPARATUS AND MANUFACTURING METHOD OF GROUP III NITRIDE SEMICONDUCTOR ELEMENT, AND SEMICONDUCTOR WAFER MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing apparatus and a manufacturing method of a group III nitride semiconductor element and a semiconductor wafer manufacturing method, which are suitable for mass production and achieve growth of a group III nitride semiconductor at lower temperature than ever before.SOLUTION: A manufacturing apparatus of a group III nitride semiconductor element comprises: a first gas supply pipe 1300 which has at least one first gas exhaust nozzle and supplies an organic metal gas containing group III metal as a first gas; a shower head electrode 1100 arranged at a position farther than the first gas exhaust nozzle of the first gas supply pipe 1300 when viewed from a susceptor 1200; and a second gas supply pipe which supplies as a second gas, a mixed gas containing a nitrogen gas and a hydrogen gas. A mixture ratio of the hydrogen gas in the mixed gas supplied by the second gas supply pipe is represented as a volume flow rate within a range of not less than 5% and not more than 45%.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016134611(A) |
申请公布日期 |
2016.07.25 |
申请号 |
JP20150010727 |
申请日期 |
2015.01.22 |
申请人 |
NAGOYA UNIV |
发明人 |
HORI MASARU;ODA OSAMU;SEKINE MAKOTO;KONDO HIROKI;ISHIKAWA KENJI |
分类号 |
H01L21/205;C23C16/34;C23C16/455;C23C16/509;H01L21/20;H01L21/338;H01L29/778;H01L29/812;H01L33/32 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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