发明名称 Method of manufacturing semiconductor mirror wafers
摘要 <p>A method of manufacturing semiconductor mirror wafers includes a double side primary mirror polishing step and a single side final mirror polishing step. The method having the double side mirror polishing step is capable of higher flatness level wafer processing, suppression of fine dust or particles, thereby to increase the yield of semiconductor devices, higher productivity due to simplification of processes, higher quality processing with lower manufacturing cost than conventional methods. &lt;IMAGE&gt;</p>
申请公布号 EP0754785(B1) 申请公布日期 1999.12.29
申请号 EP19960111698 申请日期 1996.07.19
申请人 SHIN-ETSU HANDOTAI COMPANY LIMITED 发明人 MASUMURA, HISASHI;SUZUKI, KIYOSHI;KUDO, HIDEO
分类号 B24B37/07;B24B37/20;B24B37/24;C30B33/00;H01L21/304;(IPC1-7):C30B33/00 主分类号 B24B37/07
代理机构 代理人
主权项
地址