发明名称 METHODS FOR DRY PLASMA ETCHING AND FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide methods for dry plasma etching and for manufacturing a semiconductor device, causing no charging damage. SOLUTION: A method for etching a conductive film 12 connected electrically to the electrode on the gate oxide film 6 formed on a substrate 2, thereby a mask 15 consisting of conductive materials is formed on the conductive film 12 and the conductive film 12 is etched using the mask 15.
申请公布号 JP2002329707(A) 申请公布日期 2002.11.15
申请号 JP20010126758 申请日期 2001.04.24
申请人 APPLIED MATERIALS INC 发明人 BOKU SEIRETSU;TAKAKURA YASUSHI
分类号 H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/302
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