发明名称 |
METHODS FOR DRY PLASMA ETCHING AND FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide methods for dry plasma etching and for manufacturing a semiconductor device, causing no charging damage. SOLUTION: A method for etching a conductive film 12 connected electrically to the electrode on the gate oxide film 6 formed on a substrate 2, thereby a mask 15 consisting of conductive materials is formed on the conductive film 12 and the conductive film 12 is etched using the mask 15.
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申请公布号 |
JP2002329707(A) |
申请公布日期 |
2002.11.15 |
申请号 |
JP20010126758 |
申请日期 |
2001.04.24 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
BOKU SEIRETSU;TAKAKURA YASUSHI |
分类号 |
H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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