发明名称 INSTURUMENT FOR INSPECTING ILLUMINATING OPTICAL ELEMENT, AND METHOD FOR INSPECTING ILLUMINATING OPTICAL ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide an instrument for inspecting an illuminating optical element with which the illuminating optical element can be efficiently inspected and the manufacturing cost of the element is suppressed and to provide a method for inspecting the illuminating optical element. SOLUTION: A lens array inspection instrument 2 is provided with: a light source 320 which emits parallel luminous flux; lens array holders 312, 313 for holding lens arrays 113, 115 respectively which are the subjects of inspection and which divide the parallel luminous flux into a plurality of partial luminous fluxes, and a ground glass plate 170 on which the optical image of the luminous fluxes emitted through these lens arrays 113, 115 is projected. A parting frame corresponding to the designed illumination region is formed on this ground glass plate 170. Consequently, the quality of the lens arrays 113, 115 is judged by observing whether an optical image projected on the ground glass plate 170 includes the range of the parting frame.
申请公布号 JP2002328205(A) 申请公布日期 2002.11.15
申请号 JP20020052106 申请日期 2002.02.27
申请人 SEIKO EPSON CORP 发明人 KITABAYASHI MASASHI
分类号 G02B3/00;(IPC1-7):G02B3/00 主分类号 G02B3/00
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