发明名称 Method for forming a barrier/seed layer for copper metallization
摘要 A method for improving adhesion of Cu to a Ru layer in Cu metallization. The method includes providing a substrate in a process chamber of a deposition system, depositing a Ru layer on the substrate in a chemical vapor deposition process, and forming a Cu seed layer on the Ru layer to prevent oxidation of the Ru layer. The Cu seed layer is partially or completely oxidized prior to performing a Cu bulk plating process on the substrate. The oxidized portion of the Cu seed layer is substantially dissolved and removed from the substrate during interaction with a Cu plating solution, thereby forming a bulk Cu layer with good adhesion to the underlying Ru layer.
申请公布号 US2006223310(A1) 申请公布日期 2006.10.05
申请号 US20050096095 申请日期 2005.03.31
申请人 TOKYO ELECTRON LIMITED 发明人 SUZUKI KENJI
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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