发明名称 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
摘要 <p>A positive resist composition which comprises: a resin ingredient (A) whose alkali solubility increases by the action of an acid; and an acid generator ingredient (B) which generates an acid upon exposure to light, wherein the resin ingredient (A) is a mixture of a copolymer (A1) having a structural unit (a1) derived from an acrylic ester containing a cyclic acid-dissociable dissolution-inhibitive group and a copolymer (A1') having a structural unit (a1') derived from an acrylic ester containing a branched acid-dissociable dissolution-inhibitive group. The positive resist composition can form a resist pattern having excellent resolution.</p>
申请公布号 WO2006134739(A1) 申请公布日期 2006.12.21
申请号 WO2006JP309475 申请日期 2006.05.11
申请人 TOKYO OHKA KOGYO CO., LTD.;SASAKI, KAZUHITO;SHIMIZU, HIROAKI;KOHNO, SHINICHI 发明人 SASAKI, KAZUHITO;SHIMIZU, HIROAKI;KOHNO, SHINICHI
分类号 G03F7/039;H01L21/027 主分类号 G03F7/039
代理机构 代理人
主权项
地址