发明名称 POSITIVE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
摘要 <p>Disclosed is a positive resist composition containing a resin component (A) and an acid generator component (B). The resin component (A) is composed of a copolymer having a mono(a-lower alkyl)acrylate unit (a0) containing a carboxy group and/or a hydroxyl group, a mono(a-lower alkyl)acrylate unit (a1) containing an acid-cleavable dissolution inhibiting group, a mono(a-lower alkyl)acrylate unit (b1) containing a lactone ring, and a constitutional unit (c1) derived from the formula (1) below. Also disclosed is a positive resist composition containing a resin component (A)' whose alkali solubility is increased by the action of an acid and the above-described component (B). The resin component (A)' is composed of a star polymer having a core portion containing an acid-cleavable dissolution inhibiting group, and an arm portion containing the constitutional unit (a0). (1) (In the formula, R represents a lower alkyl group or a hydrogen atom; R&lt;SUP&gt;11&lt;/SUP&gt; and R&lt;SUP&gt;12&lt;/SUP&gt; independently represent a lower alkyl group; n represents an integer of 1-5; and A represents a divalent to hexavalent organic group.)</p>
申请公布号 WO2006134967(A1) 申请公布日期 2006.12.21
申请号 WO2006JP311926 申请日期 2006.06.14
申请人 TOKYO OHKA KOGYO CO., LTD.;TAKESHITA, MASARU;UTSUMI, YOSHIYUKI;HAYASHI, RYOTARO;HADA, HIDEO 发明人 TAKESHITA, MASARU;UTSUMI, YOSHIYUKI;HAYASHI, RYOTARO;HADA, HIDEO
分类号 C08F220/10;G03F7/039;H01L21/027 主分类号 C08F220/10
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