发明名称 MEASUREMENT CHIP, MEASUREMENT DEVICE, AND MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a measurement chip higher in sensitivity than before, a measurement device on which the measurement chip is disposed, and a measurement method using the measurement chip.SOLUTION: A central position of a dielectric substance 11 is provided with a specific pattern 12 which is a place where a hole 13 is omitted (the hole 13 is not formed). The specific pattern 12 is a place in an arrangement mode different from a periodical arrangement. A periodic structure by the hole 13 functions as a mirror reflecting light of a specific wavelength region (for example, 620 nm to 680 nm). Here, the specific pattern 12 functions as a space surrounded with such a mirror. Thereby, the specific pattern 12 functions as a resonator for resonating light of the specific wavelength. Consequently, when the chip 1 is irradiated with light, light alone of the specific wavelength region can be emitted from the specific pattern 12 with an extremely high SN ratio.SELECTED DRAWING: Figure 3
申请公布号 JP2016156727(A) 申请公布日期 2016.09.01
申请号 JP20150035426 申请日期 2015.02.25
申请人 OSAKA PREFECTURE UNIV;FURUNO ELECTRIC CO LTD 发明人 ENDO TATSURO;TADA KEIJI;YAMABAYASHI JUN
分类号 G01N21/47 主分类号 G01N21/47
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