| 摘要 |
PURPOSE:To reduce the test time through the simultaneous test of a plurality of storage units, by providing logical elements which can control the states so that readout information is not affected on respective write information lines and outputted to respective write information lines. CONSTITUTION:Logical elements which can control the states so that readout information is not affected on respective write information lines and is outputted to respective write information lines, are provided. For example, in normal usage, logical elements 61-64 of a storage device 1 are kept to high impedance with a control signal line 43 so that readout information can not be affected on write information lines 21-24. In performing test, write information generated from a signal generating circuit 3 of a test device 2 is inputted to logical elements 71-74, this output is inputted to storage units 11-14 via the input signal lines 21-24, and a branched output is inputted to the test device 2 via signal lines 51-54. In case of write, the logical elements 61-64 are kept to high impedance and for the readout, the logical elements 71-74 are kept to high impedance. |
