发明名称 SYNTHETIC TESTER FOR SMALL LEADING CURRENT BREAKING TEST
摘要 <p>PURPOSE:To inspect the cut-off capacity of a small leading current in a state near to a use state, by a method wherein AC voltage is applied to the terminal on a power supply side of a breaker tested after a current is cut off and, at the same time, voltage on a load side is applied to the other terminal from a DC voltage source condenser. CONSTITUTION:A delay current is supplied to a breaker 5 tested from a current source circuit 14 through an auxiliary breaker 6b and, further, a delay current is supplied from the voltage source circuit 13 on a power supply side connected to the current source circuit 14 in parallel. The breaker 5 tested and auxiliary breakers 6a, 6b are opened and a current is cut off while the current source circuit 14 is separated to apply high voltage to the single pole of the breaker 5 tested from the voltage source circuit 13 on the power supply side. DC voltage is applied to the junction point of the breaker 5 tested and the auxiliary breaker 6a from the preliminarily charged condenser 10 of the voltage supply circuit 15 on the load side. By this method, the voltage equal to the voltage applied when a small leading current is cut off is applied between the electrodes of the breaker 5 being tested.</p>
申请公布号 JPH01292274(A) 申请公布日期 1989.11.24
申请号 JP19880121857 申请日期 1988.05.20
申请人 TOSHIBA CORP 发明人 KUDO KIETSU;MIYAKE NOBUYUKI;IKEDA HISATOSHI;YAMASHITA SHOJI
分类号 G01R31/327;G01R31/333 主分类号 G01R31/327
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