发明名称 Semiconductor processing method of producing an isolated polysilicon lined cavity and a method of forming a capacitor
摘要 A semiconductor processing includes: a) providing an area atop a semiconductor wafer to which electrical connection to a polysilicon containing component is to be made; b) providing a layer of first material atop the semiconductor wafer, the first material layer having an upper surface; c) providing a contact opening in the layer of first material to the area, the contact opening having a selected open cross dimension; d) providing a layer of polysilicon to a selected thickness atop the layer of first material and within the contact opening to contact the area, the selected thickness being less than one-half the open dimension such that polysilicon less than completely fills the contact opening and thereby defines an outwardly open polysilicon lined cavity; e) with the wafer having the polysilicon lined cavity outwardly open, chemical mechanical polishing with a chemical mechanical polishing slurry the polysilicon atop the first material layer to the upper first material layer surface to define an isolated polysilicon lined cavity; and f) removing chemical mechanical polishing slurry residuals from the outwardly open polysilicon lined cavity.
申请公布号 US5391511(A) 申请公布日期 1995.02.21
申请号 US19930000891 申请日期 1993.01.05
申请人 MICRON TECHNOLOGY, INC. 发明人 DOAN, TRUNG T.;DENNISON, CHARLES H.
分类号 H01L21/02;H01L21/321;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/265 主分类号 H01L21/02
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