发明名称 SCANNING PROXIMITY FIELD OPTICAL MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a scanning proximity field optical microscope capable of measuring a sample for its three-dimensional data by one scanning. SOLUTION: In this scanning proximity field optical microscope, a probe 2 is arranged in the vicinity of the surface of a sample 1, and the vicinity of surface of the sample 1 is measured with light as the probe 2 is scanning the surface of the sample 1. Especially by being provided with a scanner 3 for a probe for vibrating the probe 2 approximately vertically with respect to the surface of the sample 1 when scanning, a photodetector 8 for probe-location detection for detecting the distance between the surface of the sample 1 and the probe 2, and a data retaining mechanism 12 for retaining signals detected by approximately vertical scanning with respect to the surface of the sample 1 as more than two measurement data rows formed according to a sampling table, it is possible to obtain the threedimensional data on the surface of the sample 1.
申请公布号 JPH10160740(A) 申请公布日期 1998.06.19
申请号 JP19960322897 申请日期 1996.12.03
申请人 OLYMPUS OPTICAL CO LTD 发明人 ONADA TAKESHI
分类号 G01B11/30;G01N37/00;G01Q10/04;G01Q20/02;G01Q30/04;G01Q60/18;G01Q60/32;(IPC1-7):G01N37/00 主分类号 G01B11/30
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