发明名称 Memory circuit with flexible bitline-related and/or wordline-related defect memory cell substitution
摘要 The inventive memory circuit comprises a main memory block and a substitution memory block for substitution of defect memory cells, with the substitution memory block being external to the main memory block. The substitution memory block is arranged to substitute at least one bitline-related or wordline-related set of memory cells being connected to the same bitline or wordline, respectively. Furthermore, the inventive memory circuit comprises redirection means for redirecting the access to a memory cell of the at least one respective substituted set of memory cells to the substitution memory block.
申请公布号 US7263011(B2) 申请公布日期 2007.08.28
申请号 US20050246046 申请日期 2005.10.07
申请人 INFINEON TECHNOLOGIES AG 发明人 GOUIN VINCENT;HIREL LINDA;PALAU LUC
分类号 G11C7/00 主分类号 G11C7/00
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