发明名称 MEMORY SYSTEM WITH FLASH MEMORY CAPABLE OF COMPENSATING REDUCTION OF READ MARGIN BETWEEN STATES DUE TO HOT TEMPERATURE STRESS
摘要 A memory system with a flash memory capable of compensating reduction of read margin due to high temperature stress is provided to assure read margin between adjacent states even if a threshold voltage is varied due to electric field coupling/F-poly coupling and HTS(High Temperature Stress). A memory system includes a flash memory and a memory controller for controlling the flash memory. The memory controller judges whether program data provided from a host during a program operation mode is stored in the flash memory. The memory controller performs a dummy program operation on a word line next to a final word line where the program data is stored, when all the program data is stored in the flash memory.
申请公布号 KR20070094706(A) 申请公布日期 2007.09.21
申请号 KR20070080149 申请日期 2007.08.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, SANG GU;LIM, YOUNG HO
分类号 G11C16/10;G11C16/08;G11C16/26 主分类号 G11C16/10
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