发明名称 Semiconductor integrated circuit with fuse data read circuit
摘要 A first fuse element, a second fuse element, a read trim value automatic adjustment circuit, and a fuse data read circuit are provided. The second fuse element determines a data reading condition for the first fuse element. The read trim value automatic adjustment circuit applies a constant voltage across the second fuse element prior to reading data from the first fuse element, then reads data from the second fuse element and, on the basis of the results of the read, outputs a trim value to specify the desired read condition for the first fuse element. The fuse data read circuit applies a constant voltage across the first fuse element and then reads data from it according to the read timing or the read reference voltage set on the basis of the trim value output from the read trim value automatic adjustment circuit.
申请公布号 US7307864(B2) 申请公布日期 2007.12.11
申请号 US20060409389 申请日期 2006.04.21
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KOHARA KOJI
分类号 G11C17/00 主分类号 G11C17/00
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