发明名称 METHOD OF FORMING A GUARD RING OR CONTACT TO AN SOI SUBSTRATE
摘要 <p>A method is provided of forming a conductive element in contact with a bulk semiconductor region of a semiconductoron-insulator ("SOI") substrate. A first opening is formed in a conformal layer overlying a trench isolation region. The trench isolation region may share an edge with an SOI layer of the substrate. Desirably, a dielectric layer is deposited over a top surface of the conformal layer an the trench isolation region. A second opening can then be formed which extends through the dielectric layer and the first opening in th conformal layer. Desirably, portions of the bulk semiconductor region and the top surface of the conformal layer are exposed within the second opening. The second opening can then be filled with at least one of a metal or a semiconductor to form a conductive element contacting the exposed portions of the bulk semiconductor region and the top surface of the conformal layer.</p>
申请公布号 WO2009006197(A1) 申请公布日期 2009.01.08
申请号 WO2008US68332 申请日期 2008.06.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;TESSIER, AMANDA, L.;TESSIER, BRIAN;COLWILL, BRYANT 发明人 TESSIER, AMANDA, L.;TESSIER, BRIAN;COLWILL, BRYANT
分类号 H01L21/00 主分类号 H01L21/00
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