发明名称 WAVEMETER FOR LIGHT
摘要 PROBLEM TO BE SOLVED: To provide a wavemeter for light in which fluctuation of interference frequency due to a heat mass generated in an interference path can be suppressed while enhancing the accuracy of measurement. SOLUTION: A reference light and a measuring light from a reference light source 1 and a measuring light source 16 are split, reflected and multiplexed, respectively, by means of a beam splitter 2, a fixed mirror 3 and a moving mirror 4 to generate a reference interference light and a measuring interference light which are then subjected to photoelectric conversion and the interference wave numbers N, K are counted at wave number counting sections 11, 12. The air is fed to the interference optical path using a fan 15 and, while stirring a tot mass generated in the interference optical path, a moving mirror 4 is moved in the direction of optical axis through a linear motion mechanism 5 and then the moving mirror 4 is located by means of three positional sensors 6, 7, 8. Wave numbers N, K, a positional signal, and a reference light wavelengthλ1 are inputted to an arithmetic section 13 where the wavelengthλ2 of measuring light is calculated for each moving section of moving mirror 4 and averaged and then the operation results are presented at a display section 14.
申请公布号 JPH09178567(A) 申请公布日期 1997.07.11
申请号 JP19950350581 申请日期 1995.12.22
申请人 ANDO ELECTRIC CO LTD 发明人 NAGASHIMA SHINYA
分类号 G01J9/02;(IPC1-7):G01J9/02 主分类号 G01J9/02
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