发明名称 THICK FILM CIRCUIT LITHOGRAPHY DEVICE
摘要 PURPOSE:To accurately conduct the measurement of a height of the surface of a material to be coated and the vertical movements of a nozzle in a real time by measuring the height of the surface of the material directly under a position isolated at a predetermined distance from the nozzle forward of the reactive movement of the nozzle for discharging thick film paste by a sensor, storing its sensor information to a shift register at each predetermined time, and shifting it. CONSTITUTION:The height from the surface of a material 3 to be coated directly under a sensor 5 disposed at a predetermined distance from a nozzle 2 forward of the relative movement of the nozzle 2 for discharging thick film paste 1 is measured by the sensor 5 to measure the height of the surface of the material 3 directly thereunder. Its sensor information is stored in a shift register 7 through a sensor information line 6 at each predetermined time, and shifted. Since the sensor 5 is always preceded on the moving passage of the nozzle 2, the stored sensor information is output at the time delay in which the nozzle 2 is arrived at the measured distance position of the sensor 5, and used as the height information of the surface of the material 3 directly under the nozzle 2. A height information selector 9 calculates the delay time, and selects the height information through a shift register information line 8.
申请公布号 JPH01308093(A) 申请公布日期 1989.12.12
申请号 JP19880140011 申请日期 1988.06.07
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YOSHIMOTO YOSHITERU;ANDO TAKEO;KABESHITA AKIRA
分类号 B41F17/36;B43L13/00;H05K3/10;H05K3/12 主分类号 B41F17/36
代理机构 代理人
主权项
地址