TESTING DEVICE FOR INTEGRATED CIRCUIT,申请号JP19750087637-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	TESTING DEVICE FOR INTEGRATED CIRCUIT
摘要
申请公布号	JPS5210643(A)	申请公布日期	1977.01.27
申请号	JP19750087637	申请日期	1975.07.16
申请人	FUJITSU LTD	发明人	KARINO TOSHIO
分类号	G01R31/28;G01R31/00;G01R31/26;G01R31/3183;G06F11/22	主分类号	G01R31/28
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Mains plug suppressing interference caused by the supply current.

Fibre advancing duct for friction-spinning devices.

A foldable goods container.

Toggle fastener.

Printing unit for a rotary offset-printing press.

Laser utilising a negative branch unstable cavity resonator.

Load clamp having motor-powered screw-type clamping actuator capable of accurate positioning and high clamping force.

Parison transferring means.

Chemical vapour deposition process.

Processing method of image data and system therefor.

Marking device for pipe.

Device for keeping animals.

Positive displacement air compressors.

Lead delivery mechanism for a mechanical pencil.

Salts of 5'-methylthio-5'-deoxyadenosine with long-alkyl chain sulphonic acids.

System and devices for the connection of photodetectors and optic fiber.

Method of making moulds of a high melting point metal by spraying said metal onto a filled silicone-rubber former.

Color-forming couplers and their use in the analytical determination of hydrogen peroxide or other analytes.