发明名称 X-Ray examination device employing double-slit beam collimation
摘要 An X-ray examination device has an X-ray tube, a primary X-ray diaphragm attached to the X-ray tube and disposed close to the focus thereof, a patient support bed, and an X-ray exposure device disposed behind the patient's support bed in the radiation direction having an X-ray image carrier and a stray radiation screen. The primary X-ray diaphragm includes a first slit beam collimator for generating a fan-shaped radiation beam and the X-ray exposure device has a second slit beam collimator in the form of two displaceable diaphragm plates and an adjustment device for moving the plates relative to one another to achieve a slit opening therebetween of desired width. The examination device further includes synchronized drive units for moving the X-ray tube and the second beam collimator in fixed alignment for sweeping the radiation beam across a patient on the support bed.
申请公布号 US4490835(A) 申请公布日期 1984.12.25
申请号 US19820421398 申请日期 1982.09.22
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 WONS, HEINZ
分类号 G01N23/04;A61B6/06;G21K1/02;G21K1/04;(IPC1-7):G03B41/16 主分类号 G01N23/04
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