发明名称 CONDUCTIVE PAD WITH HIGH ABRASION
摘要 <p>A method and apparatus for a planarizing or polishing article for Electrochemical Mechanical Planarization (ECMP) is disclosed. The polishing article is a pad assembly (122) having a plurality of conductive domains and a plurality of abrasive domains on a processing surface. The abrasive domains and the conductive domains comprise a plurality of contact elements (150) that are adapted to bias a semiconductor substrate (115) while also providing abrasive qualities to enhance removal of material deposited on the substrate.</p>
申请公布号 WO2006093625(A1) 申请公布日期 2006.09.08
申请号 WO2006US04114 申请日期 2006.02.06
申请人 APPLIED MATERIALS, INC.;HU, YONGQI;TSAI, STAN D.;WOHLERT, MARTIN S.;LIU, FENG Q.;CHEN, LIANG-YUH 发明人 HU, YONGQI;TSAI, STAN D.;WOHLERT, MARTIN S.;LIU, FENG Q.;CHEN, LIANG-YUH
分类号 B23H5/08;B24B37/04;H01L21/687;H01L23/48 主分类号 B23H5/08
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