<p>A method and apparatus for a planarizing or polishing article for Electrochemical Mechanical Planarization (ECMP) is disclosed. The polishing article is a pad assembly (122) having a plurality of conductive domains and a plurality of abrasive domains on a processing surface. The abrasive domains and the conductive domains comprise a plurality of contact elements (150) that are adapted to bias a semiconductor substrate (115) while also providing abrasive qualities to enhance removal of material deposited on the substrate.</p>
申请公布号
WO2006093625(A1)
申请公布日期
2006.09.08
申请号
WO2006US04114
申请日期
2006.02.06
申请人
APPLIED MATERIALS, INC.;HU, YONGQI;TSAI, STAN D.;WOHLERT, MARTIN S.;LIU, FENG Q.;CHEN, LIANG-YUH
发明人
HU, YONGQI;TSAI, STAN D.;WOHLERT, MARTIN S.;LIU, FENG Q.;CHEN, LIANG-YUH