发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate processing apparatus capable of removing a deposited film in a processing chamber, while using a chemical reaction and reducing metal contamination giving adverse effects on the manufacturing of a semiconductor device, and to provide a manufacturing method of a semiconductor device. SOLUTION: The substrate processing apparatus is provided with a processing chamber for processing a substrate; a gas supply section for supplying a gas into the processing chamber; a support pedestal for supporting the substrate in the processing chamber; and a plate to be disposed around the substrate in processing the substrate. At least either the support pedestal or the plate has a built-in electrode for turning the gas to be supplied from the gas supply portion into a plasma. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008211106(A) |
申请公布日期 |
2008.09.11 |
申请号 |
JP20070048277 |
申请日期 |
2007.02.28 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
HORII SADAYOSHI;NOUCHI HIDEHIRO;TANABE MITSUAKI;SANO ATSUSHI |
分类号 |
H01L21/205;C23C16/44;H01L21/31 |
主分类号 |
H01L21/205 |
代理机构 |
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地址 |
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