<p>The invention relates to an atomic force microscope including a microtip placed on a flexible support connected to a microscope head facing a surface to be studied, which includes means for controlling the distance between the head and the surface for a given value and means for inhibiting vibration of the microtip.</p>
申请公布号
EP2029998(A1)
申请公布日期
2009.03.04
申请号
EP20070766092
申请日期
2007.05.23
申请人
UNIVERSITE JOSEPH FOURIER;EUROPEAN SYNCHROTRON RADIATION FACILITY;INSTITUT NATIONAL POLYTECHNIQUE DE GRENOBLE;CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
