发明名称 METHOD AND APPARATUS FOR FORMING THIN FILM ON SURFACE OF SEMICONDUCTOR SUBSTRATE
摘要 PURPOSE:To eliminate contaminant etc., without washing, eliminate an oxide film without damaging a substrate, and form a thin film without exposing to the air by eliminating organic contaminant, etc., stuck to the surface of the semiconductor substrate and then forming a thin film on the cleaned surface. CONSTITUTION:A semiconductor substrate 13 is exposed to an atmosphere including oxidizing gas and a light is applied to the substrate 13 while heated to oxidize the surface of the substrate 13 by photochemical reaction, and eliminate harmful organic contaminant etc., 20 which may be stuck to the surface of the substrate 13. At the same time, an extremely thin oxide film 21 to take a harmful metal pollution layer or surface damaging layer thereinto is grown on the surface of the substrate 13. The oxide film 21 is eliminated by applying a light in an atmosphere including chloric gas to expose the cleaned surface of the substrate, and a thin film 22 is formed continuously on the cleaned surface without exposing to the air.
申请公布号 JPH01319944(A) 申请公布日期 1989.12.26
申请号 JP19880154118 申请日期 1988.06.21
申请人 MITSUBISHI ELECTRIC CORP 发明人 TSUKAMOTO KATSUHIRO;TOKUI AKIRA
分类号 H01L21/20;H01L21/306;H01L21/316;H01L21/318 主分类号 H01L21/20
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