| 摘要 |
The present invention relates to a semiconductor test interface for interfacing a DUT (Device Under Test) to a pin card using a cable comprising a DUT board including one or more first connectors for electrically connecting one or more test sockets for mounting the DUT to the one or more cables, and a circuit wiring for electrically connecting the one or more test sockets to the one or more first connectors; and the one more cable including a second connector for an electrical connection to the one or more first connectors, and a third connector for an electrical connection to the pin card, wherein the one or more first connectors correspond to the one or more cables by 1:1. In accordance with the present invention, the manufacturing cost is reduced by simplifying the manufacturing process and the semiconductor test interface may easily correspond to the test of the different DUTs.
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