发明名称 METHOD FOR FINDING ABNORMAL DATA IN EARLY STAGE USING RUN EXAMINATION
摘要 PROBLEM TO BE SOLVED: To find intentional abnormal data from the large amount of time sequential data in an early stage by performing division into stages beforehand, calculating the statistic of a run examination for the respective stages and detecting the indication of the change. SOLUTION: At the time of performing input as a file, a time sequential data file 11 is converted to a binary data file in a binary converter 12 so as to be handled in the run examination. In order to divide the time sequential data stored in a binary conversion file 13 into several stages, the length of one stage and a shifting period are set. They are divided into the stages in a stage setting device 14 based on the value. Then, by a run examination execution device 15, the statistic is calculated for the respective stages generated in the stage setting device 14. The difference of the obtained statistics of the respective stages and a judging statistic set beforehand are compared and the statistics and a judged result are outputted to a result file 16. Thus, since the indication of the change is detected, the abnormal data are found in the early stage in a short time.
申请公布号 JPH10293757(A) 申请公布日期 1998.11.04
申请号 JP19970101330 申请日期 1997.04.18
申请人 HITACHI LTD 发明人 ONOZATO HIROYUKI
分类号 G06F17/18;G06F17/00;G06Q10/00;G06Q50/00;G06Q50/10;G06Q90/00 主分类号 G06F17/18
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