发明名称 PATTERN-DETECTING SYSTEM
摘要 PURPOSE:To increase the speed of detection of a pattern by carrying out the detection without stopping a sample table by continuously moving the sample table and scanning a load beam over a right position on a sample according to the positional information of the sample table. CONSTITUTION:A sample table 6 at first begins to move from the point (X01, Y01) to the point (X01, Y01) according to a command from a sample-table-controlling device 8. At this point, the reference point (X01, Y01) of the first rectangular area is sent to an arithmetic unit 7 by means of a rectangular area reference point assigning device 9. After the smaple table 6 starts to move, coordinates (X, Y) specifying the position of the sample table 6 are measured by the actual time by means of a sample-table-position-measuring device 5 before being sent to the arithmetic unit 7 as necessary. The arithmetic unit 7 computes the reference point (X0m, Y0n) of a rectangular area which is to be used as an input as well as the positional gap between the sample table 6 and the rectangular area at that point. A reference deflection signal produced by a deflection-signal producer 1 and a beam-position-correcting signal are added by an adder 2 so as to deflect a load beam toward a right rectangular area through a deflecting amplifier 3 and a deflecting coil 4.
申请公布号 JPS59160948(A) 申请公布日期 1984.09.11
申请号 JP19830032713 申请日期 1983.03.02
申请人 HITACHI SEISAKUSHO KK 发明人 YOSHIDA KAZUSHI;HAMADA TOSHIMITSU;KUJI TOMOHIRO
分类号 H01J37/20;G01R31/302;H01J37/147;H01J37/28;H01J37/304;H01L21/027;H01L21/30;H01L21/66 主分类号 H01J37/20
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