发明名称 MEASURING INSTRUMENT FOR SURFACE POTENTIAL
摘要 PURPOSE:To measure a surface potential accurately without any influence of an offset potential even if it is present by providing a surface potential measuring means and an electric discharging means, a measured value holding means and a correcting means, etc. CONSTITUTION:The surface potentiometer A and the electrostatic discharging means B, the measured value holding means C and a differential arithmetic means D as the correcting means, etc. are provided. When the surface of the potentiometer A is charged electrostatically to the plus polarity, an AC signal is induced across a detection resistance 5 an outputted as a surface potential from an output terminal 6a. In this case, the value of the AC signal induced across the resistance 5 is extremely small, so the device is covered with an external shield except at a part which faces a body alpha to be measured to prevent the influence of the outside and an internal shield 2 protects a measurement system from an internal noise. If the surface potential of the potentiometer A is not measured, the means B performs electrostatic discharging and the electrometer A takes a measurement, which is stored in the means C. the surface potential value is measured again and the means D subtracts the surface potential value stored in the means C. Consequently, the surface potential value including no offset potential is obtained.
申请公布号 JPS61155863(A) 申请公布日期 1986.07.15
申请号 JP19840274911 申请日期 1984.12.28
申请人 CANON INC 发明人 ISHIKAWA TADASHI
分类号 G01R19/145;G01R19/00;G01R29/12;G03G15/00;G03G21/00 主分类号 G01R19/145
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