| 摘要 |
PURPOSE:To provide the fault detection factor calculating method for a test pattern and its device capable of calculating the fault detection factor on the bridging fault of the test pattern. CONSTITUTION:Two nodes A1, B1 are selected in a net list, an exOR gate D inputted with signals from two selected nodes A1, B1 is virtually inserted into the net list, and the new net list is logically simulated, with the output signal from the exOR gate D used as a virtual external output terminal T. Whether '1' is outputted from the virtual external output terminal T for a sufficiently long period during this logical simulation or not is checked, this check is repeated for a combination of two other nodes, and the fault detection factor of the test pattern is calculated from the ratio between the number of all combinations and the number of detections of '1'. |
