发明名称 Method for producing a mask pattern
摘要 A mask pattern used in an optical exposure apparatus using a single wavelength comprises a light shielding film pattern which is produced on a transparent substrate, a pattern of transparent thin film for shifting the phase of exposure light which is produced at an aperture of the light shielding film pattern separated from the light shielding film pattern. Therefore, the resolution and the contrast of the pattern image projected on the wafer are enhanced, and the resolution and the depth of focus of photoresist which is to be patterned are improved. <IMAGE>
申请公布号 EP0461778(B1) 申请公布日期 1996.01.03
申请号 EP19910304793 申请日期 1991.05.28
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MINAMI, HIROYUKI, C/O MITSUBISHI DENKI K.K.
分类号 G03F1/68;G03F1/29;H01L21/027 主分类号 G03F1/68
代理机构 代理人
主权项
地址