FLUORESCENT MAGNETIC PARTICLE EXAMINATION METHOD AND FLAW DETECTION DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a fluorescent magnetic particle examination method and a flaw detection device capable of detecting highly accurately the edge position of a material to be inspected even when fluorescent magnetic particles are deposited on a part outside the range of the material to be inspected such as a floor or the like. SOLUTION: In this fluorescent magnetic particle examination by utilizing a flaw detection image G1 and an edge position detection image G2, the edge positions C1, C2 are detected based on a background removal image G3 acquired by subtracting the flaw detection image G1 from the edge position detection image G2.