发明名称 THICK NITRIDE SEMICONDUCTOR STRUCTURES WITH INTERLAYER STRUCTURES AND METHODS OF FABRICATING THICK NITRIDE SEMICONDUCTOR STRUCTURES
摘要 <p>A semiconductor structure includes a substrate, a nucleation layer on the substrate, a compositionally graded layer on the nucleation layer, and a layer of a nitride semiconductor material on the compositionally graded layer. The layer of nitride semiconductor material includes a plurality of substantially relaxed nitride interlayers spaced apart within the layer of nitride semiconductor material. The substantially relaxed nitride interlayers include aluminum and gallium and are conductively doped with an n-type dopant, and the layer of nitride semiconductor material including the plurality of nitride interlayers has a total thickness of at least about 2.0 µm.</p>
申请公布号 WO2008112096(A3) 申请公布日期 2009.03.05
申请号 WO2008US02828 申请日期 2008.03.04
申请人 CREE, INC.;SAXLER, ADAM WILLIAM;BURK, JR., ALBERT AUGUSTUS 发明人 SAXLER, ADAM WILLIAM;BURK, JR., ALBERT AUGUSTUS
分类号 H01L21/20 主分类号 H01L21/20
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