Passive intermodulation testing using pulse stimulus

摘要

Disclosed is a passive intermodulation (PIM) test system having a pulsed signal generator configured to generate and apply a pulsed stimulus signal to a device under test. The PIM test system is further configured to measure a power of at least one PIM product generated by a PIM source in the device under test using the pulsed stimulus signal. Also disclosed in a method for Cevaluating PIM in a device under test, the method includes using a pulsed stimulus signal to measure a power of at least one PIM product generated by a PIM source in the device under test.

主权项

1. A pulsed tone passive intermodulation (PIM) test system comprising:
a DC power source configured to provide power to said pulsed tone PIM test system; a pulse generator electrically coupled to a first transmitter and a second transmitter, said pulse generator and said first transmitter configured for generating a first pulsed stimulus signal, said pulse generator and said second transmitter configured for generating a second pulsed stimulus signal; a first bandpass filter electrically coupled to said first transmitter configured to attenuate spectral components associated with said first pulsed stimulus signal; a second bandpass filter electrically coupled to said second transmitter configured to attenuate spectral components associated with said second pulsed stimulus signal; a combiner electrically coupled to said first and second bandpass filter, said combiner configured to combine said first and second stimulus signals into a combined pulsed stimulus signal; a directional coupler having a main line with an input electrically coupled to said combiner and an output configured to be electrically coupled to a device under test, said main line configured to deliver said combined pulsed stimulus signal propagating in the forward direction to said device under test and receive a signal propagating in the reflected direction from said device under test; said directional coupler further comprised of a reflected channel output; said directional coupler further configured to sample said signal propagating in the reflected direction on said main line; said reflected channel output configured to provide said sample signal propagating in the reflected direction to a notch filter; said notch filter electrically coupled to said reflected channel output and configured to attenuate said first and second pulsed stimulus signals from said sample signal propagating in the reflected direction; a low noise gain stage electrically coupled to said notch filter, said low noise gain stage configured to amplify said sample signal propagating in the reflected direction; and a spectrum analyzer electrically coupled to said low noise gain stage configured to receive and identify at least one PIM product generated by a PIM source in said device under test.