发明名称 Apparatus for chemical etching of a wafer material
摘要 An apparatus is provided for chemically etching, for example, a semiconductor wafer material in an etching solution to remove the surface strain caused by mechanical working such as lapping and polishing. The apparatus comprises a disk rotatable around an axis in the solution and provided on the surface with groove-like liquid flow channels and a means for holding the wafer closely side-by-side to face the rotatable disk and the rotatable disk and the wafer are each rotated around its own axis with simultaneous reciprocative movement of the wafer along a radial direction of the disk so that very high degree of uniformity is ensured in the etching effect on the wafer surface.
申请公布号 US4417945(A) 申请公布日期 1983.11.29
申请号 US19830460355 申请日期 1983.01.24
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 KOMATSUZAKI, YASUO
分类号 C23F1/08;C30B33/00;H01L21/306;(IPC1-7):H01L21/30 主分类号 C23F1/08
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