发明名称 |
Apparatus for chemical etching of a wafer material |
摘要 |
An apparatus is provided for chemically etching, for example, a semiconductor wafer material in an etching solution to remove the surface strain caused by mechanical working such as lapping and polishing. The apparatus comprises a disk rotatable around an axis in the solution and provided on the surface with groove-like liquid flow channels and a means for holding the wafer closely side-by-side to face the rotatable disk and the rotatable disk and the wafer are each rotated around its own axis with simultaneous reciprocative movement of the wafer along a radial direction of the disk so that very high degree of uniformity is ensured in the etching effect on the wafer surface.
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申请公布号 |
US4417945(A) |
申请公布日期 |
1983.11.29 |
申请号 |
US19830460355 |
申请日期 |
1983.01.24 |
申请人 |
SHIN-ETSU HANDOTAI CO., LTD. |
发明人 |
KOMATSUZAKI, YASUO |
分类号 |
C23F1/08;C30B33/00;H01L21/306;(IPC1-7):H01L21/30 |
主分类号 |
C23F1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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