发明名称 FABRICATION OF DEVICES WITH A SILICON OXIDE REGION
摘要 <p>Conformal layers of a silicon oxide, such as silicon dioxide, are deposited at temperatures below 600 degrees C through the decomposition of compounds such as diacetoxyditertiarybutoxysilane. The required temperatures do not significantly affect temperature-sensitive structures. Therefore, it is possible to form silicon oxide regions in the processing of devices having these structures.</p>
申请公布号 WO1986000753(A1) 申请公布日期 1986.01.30
申请号 US1985001278 申请日期 1985.07.03
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