发明名称 OPERATION TESTER OF MICROCOMPUTER CHIP
摘要 PURPOSE:To make it possible to simply inspect the chip of the microprocessor of a system side, by using a microprocessor secured in normal operation and same to that of the system side and comparing data by a non-coincidence circuit. CONSTITUTION:An operation tester 3 for the chip of a microprocessor is constituted of a microprocessor 4 secured in normal operation and performing the same operation as one used in an applied system 1, a non-coincidence circuit 5, a gate circuit 6 and a timing circuit 7. The address pass A, data pass D and system control signal of the system 1 are inputted to the non-coincidence circuit 5 and the passes A, D and a system control signal S are inputted thereto from the microprocessor 4 and, when both data are compared and a non- coincidence signal is issued, the microprocessor of the system 1 judges abnormality. By this mecha- nism, a test can be rapidly carried out by the simple apparatus.
申请公布号 JPS61205875(A) 申请公布日期 1986.09.12
申请号 JP19850046173 申请日期 1985.03.08
申请人 NIPPON SIGNAL CO LTD:THE 发明人 YOSHIDA TOMOYUKI
分类号 G01R31/28;G06F11/16;G06F11/273 主分类号 G01R31/28
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