| 摘要 |
PURPOSE: To apply a partial scan method even to a circuit using a multi-phase clock or a gated clock, improve processing speed, and reduce an area. CONSTITUTION: A circuit is composed of flipflops 1, 5, 6, and scan flipflops 22-24. The scan flipflops 22-24 are those replaced for flipflops composing the circuit for which different clock signals from clock signals of the circuit are used in at least one destination of outputs. To the scan flipflops 22-24, scan test wiring is applied by scanning in and scanning out. Clock control circuits 11-13 fix clock signals to the flipflops 1, 5, 6 and the scan flipflops 22-24 at a specified value when the specified value is set by a scan sample signal. |
