发明名称 METHOD OF EXTRACTING TIMING CHARACTERISTICS OF TRANSISTOR CIRCUITS, STORAGE MEDIUM STORING TIMING CHARACTERISTIC LIBRARY, LSI DESIGNING METHOD, AND GATE EXTRACTION METHOD
摘要 <p>A method of extracting timing characteristics from transistor circuit data of design assets (modules) of parts such as CPU core, wherein the extracted timing characteristics are used for timing constraints in performing the timing verification, logic synthesizing or timing-driven layout of a circuit including a module to be extracted, and, when the timing verification is to be performed by simulation, in particular, the verification without a pseudo eror can be made because the timing characteristics includes a timing rule conforming conditions of the module; a structure of a timing characteristic library; a storage medium storing the library; and an LSI designing method using the same.</p>
申请公布号 WO1999009497(P1) 申请公布日期 1999.02.25
申请号 JP1998003455 申请日期 1998.08.04
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址