发明名称 CONTACT HOLE AND METHOD FABRICATING THEREOF
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device forming a contact hole, a via-hole and a via-contact hole with an excellent contact property, and a method of forming the semiconductor device. <P>SOLUTION: The semiconductor device and the manufacturing method thereof are technically characterized by comprising: an insulating substrate; a thin film transistor formed by including a semiconductor layer 103, a gate insulating film 104, a gate electrode 105 and an interlayer insulating film 106 on the substrate; and a contact hole 114 which penetrates the gate insulating film 104 and the interlayer insulating film 106 to expose a front surface of the semiconductor layer 103 and has multiplex profiles, an upper part thereof having a wet etching profile, and parts below the upper part thereof having any one or more of the wet etching profile or a dry etching profile. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 KR20050112031(A) 申请公布日期 2005.11.29
申请号 KR20040037052 申请日期 2004.05.24
申请人 SAMSUNG SDI CO., LTD. 发明人 KANG, TAE WOOK;JEONG, CHANG YONG;KIM, CHANG SOO
分类号 H01L21/28;H01L21/336;H01L21/768;H01L23/522;H01L29/786;H01L51/50;H05B33/10;H05B33/14;H05B33/22;H05B33/26;(IPC1-7):H01L29/786 主分类号 H01L21/28
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