发明名称 Manufacturing method of thin film integrated circuit device and manufacturing method of non-contact type thin film integrated circuit device
摘要 A method of manufacturing a thin film integrated circuit device according to the present invention includes steps of forming a peel-off layer over a thermally oxidized silicon substrate, forming a plurality of thin film integrated circuit devices over the peel-off layer with a base film interposed therebetween, forming a groove between the plurality of thin film integrated circuit devices, and separating the plurality of thin film integrated circuit devices by introducing one of a gas and a liquid including halogen fluoride into the groove to remove the peel-off layer.
申请公布号 US7271076(B2) 申请公布日期 2007.09.18
申请号 US20040007645 申请日期 2004.12.09
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;TAKAYAMA TORU;KANNO YOHEI
分类号 H01L21/46;G06K19/07;G06K19/077;H01L21/00;H01L21/30;H01L21/68;H01L21/762;H01L21/82;H01L23/02;H01L23/498;H01L27/00 主分类号 H01L21/46
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