发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a transistor with excellent electric characteristics in the transistor using an oxide semiconductor, and a manufacturing method for the same.SOLUTION: A transistor includes: an oxide semiconductor film formed on a base insulation film; a gate electrode overlapping with the oxide semiconductor film via a gate insulation film; and a pair of electrodes in contact with the oxide semiconductor film and functioning as a source electrode and a drain electrode. The base insulation film includes: a first oxide insulation film which is partially in contact with the oxide semiconductor film; and a second oxide insulation film provided around the first oxide insulation film. An end of the oxide semiconductor film intersecting with a channel width direction of the transistor is located on the second oxide insulation film.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016146497(A) |
申请公布日期 |
2016.08.12 |
申请号 |
JP20160048445 |
申请日期 |
2016.03.11 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI |
分类号 |
H01L21/336;G02F1/1368;H01L21/8234;H01L21/8242;H01L21/8244;H01L27/088;H01L27/108;H01L27/11;H01L29/786;H01L51/50 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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